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    12th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques

    ISBN-10: 0735401683
    ISBN-13: 9780735401686
    Author(s): P. M. Koenraad, Martijn Kemerink
    Description: At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field  More...
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    Publisher: American Institute of Physics
    Binding: Mixed Media
    Pages: 179
    Size: 6.50" wide x 9.50" long x 0.75" tall
    Weight: 1.188
    Language: English

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