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    Images of Materials

    ISBN-10: 0195058569
    ISBN-13: 9780195058567
    Edition: 1991
    Author(s): David B. Williams, Alan R. Pelton, Ronald Gronsky
    Description: This spectacularly illustrated book celebrates the structural beauty of everyday materials and the space-age technologies used to probe their surface features and internal structures. It introduces the reader to the various instruments and their  More...
    List price: $120.00
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    List Price: $120.00
    Copyright Year: 1991
    Publisher: Oxford University Press, Incorporated
    Publication Date: 1/9/1992
    Binding: Hardcover
    Pages: 394
    Size: 8.46" wide x 11.02" long x 1.26" tall
    Weight: 3.630
    Language: English

    This spectacularly illustrated book celebrates the structural beauty of everyday materials and the space-age technologies used to probe their surface features and internal structures. It introduces the reader to the various instruments and their uses: scanning electron, ion, and tunneling microscopies, acoustic microscopy and transmission electron microscopy. The book describes how images are processed and analyzed, and how modern materials science is based on these techniques and their ability to "see" materials at the atomic level. The book includes hundreds of illustrations and 32 pages of beautiful color plates depicting the complex microscopic realm within such everyday materials as the metals used in cars and planes, polymer fabrics, ceramics, and the ubiquitous silicon semiconductors, without which society today would fall into disarray and confusion. The many full-color and black-and-white illustrations make this book a pleasure for the eye, in addition to being a useful resource for scientists, students, researchers, and engineers involved in solid-state physics, materials science, geology, and chemistry.

    Imaging by Light Optical Microscopy
    Scanning Electron Microscopy
    Analytical Imaging With A Scanning Ion Microprobe
    Acoustic Microscopy
    Transmission Electron Microscopy
    Electron Diffraction Images
    Atomic Resolution Microscopy
    Surface Imaging by Scanning Tunneling Microscopy
    Atom Probe Field-Ion Microscopy: Imaging at the Atomic Level
    Compositional Mapping of the Microstructure of Materials
    Processing Images and Selecting Regions of Interest
    Image Analysis of the Microstructure of Materials

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