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Advances in Imaging and Electron Physics Selected Problems of Computational Charged Particle Optics

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ISBN-10: 0123747171

ISBN-13: 9780123747174

Edition: 155th 2009

Authors: Dmitry Greenfield, Mikhael Monastyrskii, Peter W. Hawkes

List price: $275.00
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Description:

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This monograph summarizes the authors' knowledge and experience acquired over many-years in their work on computational charged particle optics. It's main message is that even in this era of powerful computers…    
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Book details

List price: $275.00
Edition: 155th
Copyright year: 2009
Publisher: Elsevier Science & Technology
Publication date: 2/12/2009
Binding: Hardcover
Pages: 364
Size: 5.94" wide x 9.00" long x 0.75" tall
Weight: 1.540
Language: English

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the university of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals.

1. Integral equations method in electrostatics 2. Surface charge singularities near irregular surface points 3. Geometry perturbations 4. Some aspects of magnetic field simulation 5. Aberration approach and the tau-variation technique 6. Space charge in charged particle bunches 7. General properties of emission-imaging systems 8. Static and time-analyzing image tubes with axial symmetry 9. Spatial and temporal focusing of photoelectron bunches in time-dependent electric fields Appendices References